Electronic devices based on the 2D material black phosphorous - layer-dependent properties

2023

• J. Schwarz, M. Niebauer (equal contribution), M. Kolesnik-Gray, M. Szabo, P. Chava, L. Baier, J. Schulze, A. Erbe, V. Krstic, M. Rommel, A. Hutzler, Correlating 4x4 Transfer Matrix Modeling with Optical Microspectroscopy for Layer Counting of Anisotropic 2D Materials, Small Methods 7 (10), 2023, Art. No. 2300618, DOI: 10.1002/smtd.202300618

• M. Koleśnik-Gray, L. Meingast, M. Siebert, T. Unbehaun, T. Huf, G. Ellrott, G. Abellan-Saez, S.Wild, V. Lloret, U. Mundloch, J. Schwarz, M. Niebauer, M. Szabo, M. Rommel, A. Hutzler, F. Hauke, A. Hirsch, V. Krstić, Unconventional conductivity increase in multilayer black phosphorus, npj 2D Materials and Applications 7, 2023, Art. No. 21, DOI: 10.1038/s41699-023-00384-2

2020

• A. Hutzler, B. Fritsch, C. M. Matthus, M. P. M. Jank, M. Rommel, Highly Accurate Determination of Heterogeneously Stacked Van-der-Waals Materials by Optical Microspectroscopy, Scientific Reports 10, 2020, Art. No. 13676, DOI: 10.1038/s41598-020-70580-3

2019

• A. Hutzler, C. D. Matthus, C. Dolle, M. Rommel, M. P. M. Jank, E. Spiecker, L. Frey, Large-Area Layer Counting of Two-Dimensional Materials Evaluating the Wavelength Shift in Visible-Reflectance Spectroscopy, Journal of Physical Chemistry C 123 (14), 2019, pp. 9192 - 9201, DOI: 10.1021/acs.jpcc.9b00957

2017

• A. Hutzler, C. D. Matthus (equal contribution), M. Rommel, L. Frey, Generalized approach to design multi-layer stacks for enhanced optical detectability of ultrathin layers, Applied Physics Letters 110 (2), 2017, Art. No. 021909, DOI: 10.1063/1.4973968