“Advanced Materials” publishes review article on the influence of ionizing radiation on quantification for in situ and operando LP-TEM

March 7, 2025 - Researchers have developed strategies for dealing with beam effects that, when used correctly, improve LP-TEM results and make it an even more powerful analytical tool. As a result, LP-TEM has the potential to revolutionize nanoscience in liquid media. The team of authors includes the leading group in the field of LP-TEM, led by Frances M. Ross (MIT).

Liquid phase transmission electron microscopy (LP-TEM) provides extraordinary insights into material growth and degradation. It is a relatively new characterization technique for in situ and operando analysis of nanoscale processes in liquid media and offers a unique combination of temporal and spatial resolution.

However, LP-TEM results are affected by the radiation effects of the imaging electrons on the liquid medium. If poorly managed or ignored, these effects can lead to misinterpretations and erroneous conclusions. Therefore, comparing LP-TEM results with those obtained by the same technique under realistic conditions has been difficult.

In their joint review, renowned LP-TEM and radiation effects experts have identified three main categories of radiation effects and derived strategies for dealing with them. When properly applied, these strategies improve LP-TEM and make it an even more powerful analytical tool with the potential to revolutionize nanoscience in liquid media. LP-TEM is relevant to (electro-)catalysis, battery research, nanoparticle synthesis, soft matter nanostructuring, and other areas of materials science, as well as cell biology, medicine, and drug development.

The team of authors includes Dr. Birk Fritsch, Andreas Körner, and Dr. Andreas Hutzler from HI ERN, together with the leading group in the field of LP-TEM led by Prof. Frances M. Ross from the Massachusetts Institute of Technology (MIT, USA). The results of the joint work were recently published in the journal "Advanced Materials".

Original Publication

Birk Fritsch, Serin Lee, Andreas Körner, Nicholas M. Schneider, Frances M. Ross and Andreas Hutzler
The Influence of Ionizing Radiation on Quantification for In Situ and Operando Liquid-Phase Electron Microscopy.
Advanced Materials, 2025, 2415728, https://doi.org/10.1002/adma.202415728

More Information

Frances M. Ross Research Group (Website)

Contact

Dr.-Ing. Birk Fritsch

Postdoctoral Researcher

Building HIERN-Cauerstr /
Room 4009

+49 9131-12538109

E-Mail

Dr.-Ing. Andreas Hutzler

Team leader "Nanoanalysis of Electrochemical Processes"

Building HIERN-Cauerstr /
Room 4009

+49 9131-12538174

E-Mail

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